Based on the X-ray photoelectron spectroscopy(XPS) of monolayer and multila
yer dithiolene (BDN) stearyl alcohol(SA) complex Langmuir-Blodgett films on
silicon and gold substrate, respectively, we measured the attenuation leng
ths(ALs) of photoelectrons in BDN-SA LB films. Combined with the Atomic For
ce Microscopy(AFM) investigations, the results are discussed.