XPS, AFM and EIA studies of IgG molecules site-directed immobilized on APTES modified silicon wafer surfaces

Citation
Wp. Qian et al., XPS, AFM and EIA studies of IgG molecules site-directed immobilized on APTES modified silicon wafer surfaces, MOL CRYST A, 337, 1999, pp. 277-280
Citations number
3
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
MOLECULAR CRYSTALS AND LIQUID CRYSTALS SCIENCE AND TECHNOLOGY SECTION A-MOLECULAR CRYSTALS AND LIQUID CRYSTALS
ISSN journal
1058725X → ACNP
Volume
337
Year of publication
1999
Pages
277 - 280
Database
ISI
SICI code
1058-725X(1999)337:<277:XAAESO>2.0.ZU;2-R
Abstract
A convenient and efficient method for site-directed immobilization of antib odies to silicon wafer surfaces modified by 3-aminopropyltriethoxylsilane ( APTES) is reported here. X-ray photoelectron spectroscopy (XPS), atomic for ce microscopy (AFM) and enzyme immunoassay (EIA) were used to characterize the immobilized surfaces.