Local electrical properties of vanadyl phthalocyanine multilayers studied by atomic force microscopy

Authors
Chen, QY Tada, H Yamada, H Matsushige, K
Citation
Qy. Chen et al., Local electrical properties of vanadyl phthalocyanine multilayers studied by atomic force microscopy, MOL CRYST A, 337, 1999, pp. 505
Citations number
4
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
MOLECULAR CRYSTALS AND LIQUID CRYSTALS SCIENCE AND TECHNOLOGY SECTION A-MOLECULAR CRYSTALS AND LIQUID CRYSTALS
ISSN journal
1058725X → ACNP
Volume
337
Year of publication
1999
Database
ISI
SICI code
1058-725X(1999)337:<505:LEPOVP>2.0.ZU;2-X
Abstract
Atomic force microscopy (AFM) was used to study the growth and electrical p roperties of vacuum evaporated vanadyl phthalocyanine (VOPc) thin films at the initial growth stage.