Nanometer scale current-voltage charcteristics of C-60 films

Authors
Men, LQ Chen, QY Tada, H Yamada, H Matsushige, K
Citation
Lq. Men et al., Nanometer scale current-voltage charcteristics of C-60 films, MOL CRYST A, 337, 1999, pp. 519
Citations number
10
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
MOLECULAR CRYSTALS AND LIQUID CRYSTALS SCIENCE AND TECHNOLOGY SECTION A-MOLECULAR CRYSTALS AND LIQUID CRYSTALS
ISSN journal
1058725X → ACNP
Volume
337
Year of publication
1999
Database
ISI
SICI code
1058-725X(1999)337:<519:NSCCOC>2.0.ZU;2-3
Abstract
The current-voltage characteristics of C-60 films in nanometer scale are in vestigated by using atomic force microscope (AFM) with a conductive cantile ver. The results can be explained by energy band theory assuming vacuum lev el alignment.