We report on time-integrated and time-resolved photoluminescence (PL) measu
rements in 80 mu m thick GaN layers grown by hydride vapor phase epitaxy on
sapphire substrates. The PL spectra are dominated by Gee exciton transitio
ns and by three well-resolved emissions assigned to the neutral-donor-bound
exciton and two neutral-acceptor-bound exciton transitions at 3.478, 3.473
and 3.461 eV, respectively. A remarkably long radiative lifetime of 3600 p
s was determined for the acceptor-bound exciton with peak position at 3.461
eV. The temperature evolution of the recombination lifetime for the bound
excitons suggests that the main nonradiative process is connected with diss
ociation of the bound excitons into free excitons, which is in agreement wi
th the temperature dependences of the integrated PL intensities measured fo
r bound and free exciton transitions.