Photoreflectance spectroscopy investigation of GaN-AlGaN quantum well structures

Citation
Tj. Ochalski et al., Photoreflectance spectroscopy investigation of GaN-AlGaN quantum well structures, PHYS ST S-B, 216(1), 1999, pp. 221-225
Citations number
7
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA STATUS SOLIDI B-BASIC RESEARCH
ISSN journal
03701972 → ACNP
Volume
216
Issue
1
Year of publication
1999
Pages
221 - 225
Database
ISI
SICI code
0370-1972(199911)216:1<221:PSIOGQ>2.0.ZU;2-6
Abstract
Room-temperature photoreflectance spectroscopy is performed on a series of GaN-AlGaN quantum wells grown by molecular beam epitaxy. We show that the p otentialities of this powerful investigation method previously demonstrated on many low-dimensional systems can be extended to nitride-based quantum w ells for accurate large-scale characterisation. In particular, this techniq ue allows us to get rid of optical interferences that usually prevent the o bservation of free-exciton transitions below the band-gap of GaN. Such tran sitions occur in wide quantum wells, due to large built-in electric fields which also quench the oscillator strength of the transitions. Also, this te chnique allows us to magnify the features of confined excited states, which are difficult to observe by standard reflectance.