We report time-resolved photoluminescence measurements on InxGa1-xN/InyGa1-
yN single quantum wells with different levels of silicon doping. Remarkable
decay behaviour is observed in samples with zero or low doping and at high
excitation powers: carrier lifetimes which decrease with time after the la
ser pulse. The results can be attributed to photoexcited carriers giving ti
me-dependent screening of the polarization field and to doping giving perma
nent screening.