We report an investigation of the optical response of unintentionally doped
GaN on sapphire submitted to alpha particle irradiation and N-2(+)-ion imp
lantation at 5 keV. Probing the resulting damage by Raman spectroscopy we f
ind that, upon implantation, the ratio of A(1)(LO) and E-2 modes increases.
This shows that some free-carrier activation accompanies the implantation
damages. Probing next the change in optical response by low temperature pho
toluminescence, we demonstrate a complex behavior of the near-band-edge (NB
E) excitonic lines which is discussed in terms of implantation-induced effe
cts.