Observing correlated production of defects and antidefects in liquid crystals

Citation
S. Digal et al., Observing correlated production of defects and antidefects in liquid crystals, PHYS REV L, 83(24), 1999, pp. 5030-5033
Citations number
14
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
83
Issue
24
Year of publication
1999
Pages
5030 - 5033
Database
ISI
SICI code
0031-9007(199912)83:24<5030:OCPODA>2.0.ZU;2-K
Abstract
We present observations of strength-one defects and antidefects formed in i sotropic-nematic phase transition of a thin layer of nematic liquid crystal s, using optical microscopy. We measure the widths of the distributions of net winding number in small regions, and determine the exponent characteriz ing the correlation between defects and antidefects to be 0.26 +/- 0.11, in very good agreement with the value 1/4 predicted by the Kibble mechanism f or defect production. We also describe a novel technique to determine the d irector distribution in observations of defect networks.