Enhancement of X-ray fluorescence intensity from an ultra-thin sandwiched layer at grazing-emission angles

Ni ultra-thin films sandwiched with carbon thin films of different thicknes s are measured by a laboratory grazing-emission X-ray fluorescence instrume nt. The Ni K alpha intensity of the Ni ultra-thin film sandwiched with carb on layers is three times enhanced in comparison with the Ni ultra-thin film without carbon layers. In addition, oscillations caused by interference ef fects of directly observed X-ray beams and the reflected X-ray beams on the surface of the Pt substrate, are clearly observed. The periods of the osci llations depends on the thickness of the carbon layer, that is, the positio n of the Ni layer. Therefore, the thickness of the carbon layer can be esti mated. (C) 1999 Elsevier Science B.V. All rights reserved.