K. Watanabe et al., Anodizing of aluminum coated with zirconium oxide by a sol-gel process I. Effect of heat treatment on the formation of the anodic oxide film, ELECTROCH, 67(12), 1999, pp. 1243-1248
Aluminum specimens were covered with zirconium oxide films by sol-gel dip c
oating at T-h = 573 and 873 K, and then anodized galvanostatically in a neu
tral berate solution. The time-variation in the anode potential during anod
izing was monitored, and the structure of anodic oxide films was examined b
y TEM, EDX, and RES. During anodizing of specimens coated with ZrO2 at T-h
= 573 K, the anode potential, E-a, increased linearly with time, t(a), and
the slope of the E-a vs, t(a) curve increased with increasing the number of
sol-gel coatings. An anodic oxide film, which was composed of an inner Al2
O3 layer and an outer Al-Zr composite oxide layer, grew at the interface be
tween the ZrO2 layer and metal substrate during anodizing. The thickness of
the inner layer increased with t(a), whereas the thickness of the outer la
yer showed a maximum before decreasing with t(a). Specimens coated with ZrO
2 at T-h = 873 K showed E-a -jumps between 40 and 110 V just after the comm
encement of anodizing, and then a slow E-a increase. An anodic oxide film c
omposed of a single layer of Al2O3, formed beneath the ZrO2 layer during an
odizing. The mechanism of the formation of anodic oxide films on aluminum c
oated with ZrO2 films is discussed in terms of ion transport across the ano
dic oxide film.