MEASUREMENT OF KL AND LM RESONANT RAMAN-SCATTERING CROSS-SECTIONS WITH A PROTON-INDUCED CRK-ALPHA X-RAY-BEAM

The resonant Raman effect has been described as an inelastic scatterin g process occurring when the energy of the exciting x-ray beam approac hes from below the energy of an absorption edge of a target element. I t produces a scattered photon with a characteristic maximum energy and the emission of an inner-shell electron. A high monochromatic CrKalph a x-ray beam produced by protons was utilized for the measurement of t he KL type of resonant Raman scattering (RRS) cross sections in V and Cr and of the LM ones in La and Ce. In the case of V and Cr targets, t he fluorescence yields of the KL-RRS process were also extracted, whil e the fine-structure splitting in a LM-RRS spectrum was observed for t he first time. The influence of RRS into different topics of x-ray spe ctrometry, like the quantitative x-ray fluorescence analysis, the theo retical calculations of the mass attenuation coefficients or the shape of characteristic xrays emitted from low Z thick targets, is also dis cussed.