The determination of adsorption isotherms by XPS and ToF-SIMS: their role in adhesion science

Citation
Jf. Watts et Je. Castle, The determination of adsorption isotherms by XPS and ToF-SIMS: their role in adhesion science, INT J ADHES, 19(6), 1999, pp. 435-443
Citations number
13
Categorie Soggetti
Material Science & Engineering
Journal title
INTERNATIONAL JOURNAL OF ADHESION AND ADHESIVES
ISSN journal
01437496 → ACNP
Volume
19
Issue
6
Year of publication
1999
Pages
435 - 443
Database
ISI
SICI code
0143-7496(1999)19:6<435:TDOAIB>2.0.ZU;2-E
Abstract
The study of the adsorption of characteristic ions or molecules from liquid solutions by XPS or ToF-SIMS is shown to be an important experimental meth od in adhesion science. The theoretical background to adsorption and experi mental procedures necessary to yield high-quality results are described. It is shown that in most cases adsorption data conforms to the Langmuir equat ion, which enables a parameter to be defined which is proportional to the i nteraction energy between absorbate and adsorbent. A series of examples of the approach are given involving the adsorption of macromolecules, organosi lane adhesion promoters, and other organic molecules on oxidised metal and carbon fibre substrates. The estimation of the surface acidity of carbon fi bres by measuring the capacity of the surface for derivatising ions is show n to improve the accuracy of the determination. (C) 1999 Elsevier Science L td. All rights reserved.