Large-signal modelling and measuring go hand-in-hand: Accurate alternatives to indirect S-parameter methods (invited paper)

Authors
Schreurs, D Verspecht, J
Citation
D. Schreurs et J. Verspecht, Large-signal modelling and measuring go hand-in-hand: Accurate alternatives to indirect S-parameter methods (invited paper), INT J RF MI, 10(1), 2000, pp. 6-18
Citations number
40
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING
ISSN journal
10964290 → ACNP
Volume
10
Issue
1
Year of publication
2000
Pages
6 - 18
Database
ISI
SICI code
1096-4290(200001)10:1<6:LMAMGH>2.0.ZU;2-A
Abstract
Classical large-signal device models are indirectly derived from small-sign al S-parameter measurements. Due to the availability of the nonlinear netwo rk measurement system (NNMS), models can be based directly upon full two-po rt large-signal measurements, resulting in higher model accuracy. In this a rticle, we discuss three large-signal measurement-based modelling approache s. (C) 2000 John Wiley & Sons, Inc.