Molecular beam deposition of crystalline layers of polar perhydrotriphenylene inclusion compounds characterised by second harmonic generation microscopy

Citation
A. Quintel et al., Molecular beam deposition of crystalline layers of polar perhydrotriphenylene inclusion compounds characterised by second harmonic generation microscopy, J MAT CHEM, 10(1), 2000, pp. 27-30
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS CHEMISTRY
ISSN journal
09599428 → ACNP
Volume
10
Issue
1
Year of publication
2000
Pages
27 - 30
Database
ISI
SICI code
0959-9428(2000)10:1<27:MBDOCL>2.0.ZU;2-4
Abstract
Polar inclusion compounds of perhydrotriphenylene (PHTP) were grown in nm t o mu m thick crystalline layers on glass and sapphire substrates. Nucleatio n was facilitated by using silanised glass. Second harmonic generation micr oscopy and confocal second harmonic generation microscopy were used to iden tify the deposition of polar PHTP-guest layers and to determine the growth direction. Channels formed by the inclusion compound were found to grow par allel to the glass substrate.