Maskless micro-ion-beam reduction lithography

Citation
Vv. Ngo et al., Maskless micro-ion-beam reduction lithography, J VAC SCI B, 17(6), 1999, pp. 2783-2790
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B
ISSN journal
10711023 → ACNP
Volume
17
Issue
6
Year of publication
1999
Pages
2783 - 2790
Database
ISI
SICI code
1071-1023(199911/12)17:6<2783:MMRL>2.0.ZU;2-6
Abstract
An ion projection lithography (IPL) technique called maskless micro-ion-bea m reduction lithography (MMRL) is being studied for future dynamic random a ccess memory and microprocessors manufacturing. In addition to minimum feat ure sizes of 50 nm or less required of next generation lithography, this MM RL system is proposed to completely eliminate the first stage of the conven tional IPL system that contains the complicated beam optics design in front of the stencil mask and the mask itself. Its main components consist of a multi-cusp, rf plasma generator, a multi-beamlet extraction system, and an accelerator column for beam reduction. The viability of this MMRL system hi nges upon the successful development of these components, most importantly the proposed all-electrostatic accelerator column. This article describes t he different components of the MMRL system and its ion optics. Computationa l results of beam demagnification and optics optimization are also presente d along with design progress of the prototype MMRL system. (C) 1999 America n Vacuum Society. [S0734-211X(99)12606-4].