An ion projection lithography (IPL) technique called maskless micro-ion-bea
m reduction lithography (MMRL) is being studied for future dynamic random a
ccess memory and microprocessors manufacturing. In addition to minimum feat
ure sizes of 50 nm or less required of next generation lithography, this MM
RL system is proposed to completely eliminate the first stage of the conven
tional IPL system that contains the complicated beam optics design in front
of the stencil mask and the mask itself. Its main components consist of a
multi-cusp, rf plasma generator, a multi-beamlet extraction system, and an
accelerator column for beam reduction. The viability of this MMRL system hi
nges upon the successful development of these components, most importantly
the proposed all-electrostatic accelerator column. This article describes t
he different components of the MMRL system and its ion optics. Computationa
l results of beam demagnification and optics optimization are also presente
d along with design progress of the prototype MMRL system. (C) 1999 America
n Vacuum Society. [S0734-211X(99)12606-4].