D. Hambach et G. Schneider, High aperture diffractive x-ray and extreme ultraviolet optical elements for microscopy and lithography applications, J VAC SCI B, 17(6), 1999, pp. 3212-3216
Microscopy and Lithography using isotropic plasma x-ray and extreme ultravi
olet sources require condenser elements with high numerical aperture. As sh
own by coupled-wave theory, zone structures with high aspect ratios can dif
fract a sufficiently large proportion of incident radiation into a single h
igh order. This enables new diffractive optical elements for these applicat
ions with significantly increased numerical aperture. Suitable zone plate m
aterials are nickel for water window wavelengths and organic polymers for l
ambda=13 nm radiation. Copolymer and nickel zone structures have been produ
ced with aspect ratios of 15 and 11, respectively. For optimization of the
etched zone profile, the reactive ion etching process with O-2 was periodic
ally interrupted. In a first experiment at lambda=3.4 nn a nickel linear zo
ne plate with 75 nm outermost zone width and 500 nm height showed a diffrac
tion efficiency of 1% in the sixth diffraction order. (C) 1999 American Vac
uum Society. [S0734-211X(99)07106-1].