We examined the effect of the addition of homopolymers tetramethylbisphenol
A polycarbonate, TMPC, and poly(norbornene-methyl-d(3)-carboxylate), NBMC,
on the interlamellar spacing and the phase stability of symmetric poly(sty
rene-b-methyl methacrylate) diblock copolymer thin films on silicon substra
tes. The films were of thickness h, L < h < 5L, where L is the interlamella
r spacing of the microphase separated PS-b-PMMA diblock copolymer. The homo
polymers considered had degrees of polymerization, N-TMPC and N-NBMC, compa
rable to one-half of the degree of polymerization of the diblock. In the TM
PC/diblock blend, for low TMPC homopolymer concentrations, phi(TMPC) < 0.2,
the homopolymer chains were localized in the middle of the PS micro-ordere
d domains, and the interlamellar spacing increased as L/(1 - phi(TMPC)). Fo
r phi(TMPC) > 0.2 the morphology of the diblock copolymer changed to accomm
odate higher volume fractions of TMPC. This behavior is contrasted with ear
lier observations in the PS-b-PMMA/PS homopolymer system where this diblock
accommodated considerably higher PS homopolymer volume fractions while mai
ntaining a lamellar phase. In the NBMC/diblock system the interlamellar spa
cing increased as L/(1 - phi(NBMC)) for homopolymer concentrations up to ph
i(NBMC) approximate to 0.05. For phi(NBMC) > 0.05, the NBMC formed a pure l
ayer on the substrate, with the diblock maintaining its microphase separate
d structure on this layer. These results are discussed in light of mean fie
ld theory and in terms of the effect of the interfacial constraints on the
phase behavior.