Ml. Tercier-waeber et al., Submersible voltammetric probes for in situ real-time trace element measurements in surface water, groundwater and sediment-water interface, MEAS SCI T, 10(12), 1999, pp. 1202-1213
A summary of the state of the art in the development of two submersible vol
tammetric probes performed by us to allow continuous, real-time monitoring
of trace elements (Cu(II), Pb(II), Cd(II), Zn(II) and Mn(II), Fe(II)) in na
tural aquatic ecosystems is given. The first one, called the voltammetric i
n situ (VIP) profiling system, allowed in situ measurements in surface wate
r and groundwater down to 500 m. Its construction required the development
of: (i) a gel-integrated, either single or interconnected, array microsenso
r, (ii) a submersible probe and (iii) hardware, firmware and software for c
ontrol of the whole system: i.e. data transmission and acquisition, data pr
ocessing and maintenance operations. The second system, called the sediment
-water interface voltammetric in situ profiling (SIVIP) system, has been de
veloped to allow real-time, high spatial resolution trace elements concentr
ation profile measurements at the sediment-water interface. Its constructio
n required the development of: (i) a gel-integrated microsensor array with
64 individually addressable lines, (ii) a voltammetric probe based on power
ful double multiplexing system and single potentiostat allowing simultaneou
s measurements over the 64 sensor lines, and (iii) hardware, firmware and s
oftware for control of the whole system. A general description of both syst
ems as well as examples of laboratory characterization and/or field applica
tions are reported.