Hc. Neitzert et A. Piccirillo, Sensitivity of multimode bidirectional optoelectronic modules to electrostatic discharges, MICROEL REL, 39(12), 1999, pp. 1863-1871
Human Body Model ESD tests on two commercially available different types of
wavelength division multiplexing bidirectional optoelectronic modules, int
ended for data transmission over multimode optical fibers at 820 and 1320 n
m wavelengths, have been performed. These bidirectional modules incorporate
d pin diode receivers and light emitting diode in a single package. In part
icular, the 820 nm light emitting diodes had rather high damage threshold p
ulse amplitudes of about + 10,000 V under forward bias and -5000 V under re
verse bias conditions, and no active layer degradation has been observed. I
n-situ measurements of the optical transients emitted during forward bias E
SD pulses enabled a damage pulse threshold detection of a LED without the n
eed of further optoelectronic characterization. The receiver photodiodes, h
owever, were very sensitive to reverse bias ESD pulses. The InGaAs photodio
des degraded during ESD pulses with amplitudes as low as -150 V and in the
case of the Silicon photodiodes as low as -175 V. (C) 1999 Elsevier Science
Ltd. All rights reserved.