Transmission and scanning electron microscopy have been used to characteriz
e thin films of Fe oxide grown on (001)-oriented MgO using pulsed-laser dep
osition. Several films, each with a longer deposition time, and hence incre
asing thickness, were grown under similar conditions of oxygen pressure, de
position rate and substrate temperature. For shorter deposition times, i.e.
thinner films, a spinel-structured Fe oxide film occurred, while for longe
r deposition times a corundum-structured Fe oxide film formed. In some inst
ances it was found that the film had a mixture of the two structures of Fe
oxide. The analysis of these films determined that the corundum-structured
Fe oxide was being formed via a transformation from the spinel structure. T
his transformation process led to interesting thin-film morphologies and ep
itactic alignments.