We investigate carrier dynamics in a n-i-n GaAs/(AlGa)As double barrier res
onant tunneling diode in which a layer of InAs self-assembled quantum dots
is embedded in the centre of the GaAs well. A combination of photoluminesce
nce and electrical measurements on this diode shows that the dot photolumin
escence properties depend strongly on bias. In particular, they are affecte
d by tunnelling of majority (electrons) and minority (photocreated holes) c
arriers through the well. The measurements demonstrate that this type of de
vice can be used to induce controlled, resonant changes in the dot photolum
inescence as well as to probe the tunnelling process. (C) 1999 Elsevier Sci
ence B.V. All rights reserved.