Hg-Ba-Ca-Cu-O thin films prepared on SrTiO3 (100) substrates generally exhi
bit shorter c-axis unit cell lengths and lower zero-resistance superconduct
ing transition temperatures as compared to bulk. Microstructural studies of
HgBa2CaCu2O6+delta films based on X-ray diffraction (XRD) and extended X-r
ay absorption fine structure (EXAFS) revealed shorter BaO-CuO2 interplanar
distances and longer CuO2-CuO2 average distances as compared to those repor
ted for bulk compounds. It is suggested that the observed cationic disorder
causes smaller c-axis lattice parameter and is probably induced by the lat
tice mismatch between film and substrate. The observed atomic rearrangement
s are expected to influence superconducting properties of the Hg-based film
s. (C) 1999 Elsevier Science B.V. All rights reserved.