Corrugation effects in oxygen surface trapping at hyperthermal energies

Citation
Ac. Lavery et al., Corrugation effects in oxygen surface trapping at hyperthermal energies, PHYS REV L, 83(25), 1999, pp. 5286-5289
Citations number
15
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
83
Issue
25
Year of publication
1999
Pages
5286 - 5289
Database
ISI
SICI code
0031-9007(199912)83:25<5286:CEIOST>2.0.ZU;2-9
Abstract
We have measured trapping probabilities for 5-600 eV O+ ions incident on Cu (001) at 45 degrees and along the sample normal. These results have been re produced using classical trajectory simulations. In the simulations, the su rface trapping probability P-s is distinguished from the total trapping pro bability P-T At 45 degrees, the energy dependence of P-s differs significan tly from that of Na+ incident on Cu(001). Trajectory analysis shows that di fferences between the trapping trends can be attributed to differences in t he apparent surface corrugation for these two systems.