We have measured trapping probabilities for 5-600 eV O+ ions incident on Cu
(001) at 45 degrees and along the sample normal. These results have been re
produced using classical trajectory simulations. In the simulations, the su
rface trapping probability P-s is distinguished from the total trapping pro
bability P-T At 45 degrees, the energy dependence of P-s differs significan
tly from that of Na+ incident on Cu(001). Trajectory analysis shows that di
fferences between the trapping trends can be attributed to differences in t
he apparent surface corrugation for these two systems.