Chemical shift and lineshape of high-resolution NiK alpha x-ray fluorescence spectra

Citation
T. Konishi et al., Chemical shift and lineshape of high-resolution NiK alpha x-ray fluorescence spectra, X-RAY SPECT, 28(6), 1999, pp. 470-477
Citations number
24
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
X-RAY SPECTROMETRY
ISSN journal
00498246 → ACNP
Volume
28
Issue
6
Year of publication
1999
Pages
470 - 477
Database
ISI
SICI code
0049-8246(199911/12)28:6<470:CSALOH>2.0.ZU;2-X
Abstract
Nickel K-L (K alpha) x-ray fluorescence spectra of 32 kinds of materials co ntaining nickel [NiF2, NiSO4, Ni(CO3)(2), Ni(OH)(2), Ni2O3, NiTiO3, NiO, Ni Fe2O4, NiCl2, NiBr2, Nil(2), LiNiO2, NiS, NiTe, Ni3P, metal, LaNi5, Ni2P, N iCr, Ni2Si, NiB, NiSi2, acetylacetonate, K2Ni(CN)(4), and some nickel compl exes] were measured using a double-crystal x-ray fluorescence spectrometer. The shift, asymmetry and spin-orbit splitting energy were extracted from t he measured spectra. The asymmetric K alpha lineshape mas deconvoluted by L orentzian functions. It is demonstrated that the chemical state of nickel i n an unknown material can be analyzed by the use of these parameters. Copyr ight (C) 1999 John Wiley & Sons, Ltd.