Self-ordered pore structure of anodized aluminum on silicon and pattern transfer

Citation
D. Crouse et al., Self-ordered pore structure of anodized aluminum on silicon and pattern transfer, APPL PHYS L, 76(1), 2000, pp. 49-51
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
1
Year of publication
2000
Pages
49 - 51
Database
ISI
SICI code
0003-6951(20000103)76:1<49:SPSOAA>2.0.ZU;2-D
Abstract
A practical approach of transferring a hexagonal array of nanosized pores p roduced in porous alumina into silicon and other substrates is discussed. T he alumina pores have dimensions of 25-250 nm pore diameters and 50-300 nm pore spacings depending on the anodization conditions used. The characteris tics of the alumina pores and the alumina-silicon interface are studied for different substrate materials and anodizing conditions. The unique structu re of the barrier layer allows for the alumina to be directly used as an et ch mask for pattern transfer into the silicon substrate. (C) 2000 American Institute of Physics. [S0003-6951(00)00601-X].