Transmission electron microscopy study on ferroelectric domain structure in SrBi2Ta2O9 ceramics

Citation
Y. Ding et al., Transmission electron microscopy study on ferroelectric domain structure in SrBi2Ta2O9 ceramics, APPL PHYS L, 76(1), 2000, pp. 103-105
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
1
Year of publication
2000
Pages
103 - 105
Database
ISI
SICI code
0003-6951(20000103)76:1<103:TEMSOF>2.0.ZU;2-H
Abstract
A transmission electron microscopy investigation has been conducted on the domain structure in SrBi2Ta2O9 ceramics. From the 90 degrees rotation relat ionship of the electron diffraction pattern of the [001] zone axis, a 90 de grees domain wall can be confirmed. It is due to the failure of Friedel's l aw that the contrast of a 180 degrees domain wall can be identified. The an tiphase boundary can be seen clearly in the dark-field image, which is take n by the (300) superlattice reflection. The 90 degrees domain wall, as well as antiphase the boundary (APB), has an irregular configuration. The APB c ombined with the 90 degrees domain wall is also identified. (C) 2000 Americ an Institute of Physics. [S0003-6951(00)02101-X].