Modeling of the kinetics in copper chemical vapor deposition from Cu(hfac)VTMS

Citation
Mlh. Ter Heerdt et al., Modeling of the kinetics in copper chemical vapor deposition from Cu(hfac)VTMS, CHEM MATER, 11(12), 1999, pp. 3470-3475
Citations number
33
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
CHEMISTRY OF MATERIALS
ISSN journal
08974756 → ACNP
Volume
11
Issue
12
Year of publication
1999
Pages
3470 - 3475
Database
ISI
SICI code
0897-4756(199912)11:12<3470:MOTKIC>2.0.ZU;2-N
Abstract
A new model is used to describe the surface kinetics in copper chemical vap or deposition from Cu(hfac)VTMS. This model is based on nonequilibria. It p rovides a mechanism that satisfactorily describes the kinetics. In this mec hanism, next to the disproportional growth reaction, a parallel reduction r eaction is proposed, which accounts for the observed growth-rate enhancemen t by hydrogen. The new model is herein more convenient than a conventional Langmuir-type model. The reaction-rate coefficients of all reactions in the mechanism are calculated. The *VTMS desorption appears to be fast. The rea ctions involving a Cu(hfac)VTMS dissociation have a low reaction-rate const ant. Both observations confirm results reported by several other authors.