A new X-ray method for pole figure measurement is described. For data
collection a two-dimensional, position sensitive detector was used, a
so called ''area'' detector. Such a detector is available for a couple
of years now and was used mainly in single crystal analysis. In contr
ast to normal proportional or szintillation counters an excellent reso
lution in both counter directions is given. This very high resolution
should be used later on for pole figure measurements. In the present p
aper the use of this new detector in texture analysis is presented. It
will be shown that pole figures of known materials in transmission an
d reflexion mode can be received using such an ''area'' detector. The
pole figures will be compared with conventionally measured ones. Beyon
d this the orientation distribution functions (ODF) are calculated.