This paper discusses some voltage collapse indices with the help of bifurca
tion theory. Two main topics are presented: first, the identification of a
well-behaved eigenvalue as a function of load increase; second a theoretica
l interpretation of the results. For this purpose, the center manifold theo
rem is employed. The tests are carried out using the IEEE-300 Bus test syst
em. The results show that under certain considerations, the voltage collaps
e indices analyzed produce identical results. (C) 2000 Elsevier Science S.A
. All rights reserved.