2-PARAMETRIC METHOD FOR SILICON DETECTOR CALIBRATION IN HEAVY-ION ANDFISSION FRAGMENT SPECTROMETRY

Citation
Si. Mulgin et al., 2-PARAMETRIC METHOD FOR SILICON DETECTOR CALIBRATION IN HEAVY-ION ANDFISSION FRAGMENT SPECTROMETRY, Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 388(1-2), 1997, pp. 254-259
Citations number
12
Categorie Soggetti
Nuclear Sciences & Tecnology","Physics, Particles & Fields","Instument & Instrumentation",Spectroscopy
ISSN journal
01689002
Volume
388
Issue
1-2
Year of publication
1997
Pages
254 - 259
Database
ISI
SICI code
0168-9002(1997)388:1-2<254:2MFSDC>2.0.ZU;2-3
Abstract
A new procedure has been proposed for the calibration of silicon semic onductor detectors in heavy ion spectrometry. This method exploits a t wo-parametric empirical equation for the value of pulse-height defect (PHD) in detectors versus masses and energies of recorded ions. A conv enient practical guide using the mean channel values of light- and hea vy-fragment groups in spontaneous fission of Cf-252 has been developed for determining the parameters of the PHD description for a given det ector. The method being applied to heavy ion spectrometry with Si-surf ace-barrier detectors and p-i-n diodes has demonstrated good results i n a large range of masses and energies.