X-ray photoelectron spectroscopy imaging of laser ablated poly(ether imide)

Authors
Schnyder, B Wambach, J Kunz, T Hahn, C Kotz, R
Citation
B. Schnyder et al., X-ray photoelectron spectroscopy imaging of laser ablated poly(ether imide), J ELEC SPEC, 105(2-3), 1999, pp. 113-117
Citations number
6
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
105
Issue
2-3
Year of publication
1999
Pages
113 - 117
Database
ISI
SICI code
0368-2048(199912)105:2-3<113:XPSIOL>2.0.ZU;2-X
Abstract
Laser ablated samples of poly(ether imide) were analyzed by XPS-imaging and by small area X-ray photoelectron spectroscopy (XPS). XPS-imaging was capa ble of detecting concentration variations of the order of 1.5% and revealed a relatively homogeneous deposition of carbon soot around the laser-ablate d hole. A clear modification of the poly(ether imide) by the laser irradiat ion was determined within the laser-ablated hole by small area XPS. While t he relative carbon content of the polymer was increased, the nitrogen and o xygen content was reduced. (C) 1999 Elsevier Science B.V. All rights reserv ed.