Theoretical studies of interstitial boron defects in silicon

Citation
M. Hakala et al., Theoretical studies of interstitial boron defects in silicon, PHYSICA B, 274, 1999, pp. 268-270
Citations number
29
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA B
ISSN journal
09214526 → ACNP
Volume
274
Year of publication
1999
Pages
268 - 270
Database
ISI
SICI code
0921-4526(199912)274:<268:TSOIBD>2.0.ZU;2-7
Abstract
We employ pseudopotential plane-wave calculations to study the interstitial B in Si in different ionic configurations and charge states. For all charg e states the ground state is a B-Si pair in which the B atom is close to a substitutional site and the Si atom in a nearby tetrahedral position. The d efect has negative-U property and exhibits a symmetry-lowering distortion. We also report several metastable configurations which are close in formati on energy. The relation of the defects to B diffusion is discussed. (C) 199 9 Elsevier Science B.V. All rights reserved.