Tin-vacancy complexes in e-irradiated n-type silicon

Citation
M. Fanciulli et Jr. Byberg, Tin-vacancy complexes in e-irradiated n-type silicon, PHYSICA B, 274, 1999, pp. 524-527
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA B
ISSN journal
09214526 → ACNP
Volume
274
Year of publication
1999
Pages
524 - 527
Database
ISI
SICI code
0921-4526(199912)274:<524:TCIENS>2.0.ZU;2-T
Abstract
Electron irradiated n-type float-zone silicon containing tin has been inves tigated by EPR, In addition to the well known Si-G29 signal due to the SnV0 complex we have observed a group of similar EPR signals with strongly anis otropic, near-trigonal g tensors, which we label DK4. The corresponding def ects have S = 1/2 and contain one tin atom. Exposure to light at low temper atures reduces the G29 signal and increased the DK4 signals, whereas subseq uent annealing at 200 K restored the initial signal strengths. A linear rel ationship between the light-induced decay of G29 and the growth of DK4 was established, indicating that DK4 arises from SnV0 by a change of the charge state. From the observation of DK4 in the n-type material after cooling in the dark we assign DK4 to SnV-. The acceptor level E-/0 (SnV) implied by t his assignment has not been determined, but the observations indicate a pos ition below the single-acceptor level of the divacancy (E-c - 0.42 eV). (C) 1999 Elsevier Science B.V. All rights reserved.