The technique of Laplace transform deep level transient spectroscopy has be
en used to study the acceptor levels of platinum and gold diffused into dil
ute (0-5% Ge) SiGe alloys. The high-resolution spectra obtained display a f
ine structure that we interpret as the effect of alloy splitting in terms o
f the relative number of silicon and germanium atoms in the immediate proxi
mity of the transition metal. We show that Ge atoms in the first and in the
second shell of atoms surrounding the impurity perturb the electronic prop
erties of the well-known Au and Pt acceptor defects. For both defects the s
pectral distributions indicate an overpopulation of Ge-perturbed sites as c
ompared to randomly occupied sites. This can be quantitatively interpreted
in terms of an enthalpy difference of similar to 60 meV between configurati
ons with zero or one Ge in the first or second shell surrounding the impuri
ty. (C) 1999 Elsevier Science B.V. All rights reserved.