Electron-paramagnetic-resonance studies of defects in electron-irradiated p-type 4H and 6H SiC

Citation
Nt. Son et al., Electron-paramagnetic-resonance studies of defects in electron-irradiated p-type 4H and 6H SiC, PHYSICA B, 274, 1999, pp. 655-658
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA B
ISSN journal
09214526 → ACNP
Volume
274
Year of publication
1999
Pages
655 - 658
Database
ISI
SICI code
0921-4526(199912)274:<655:ESODIE>2.0.ZU;2-T
Abstract
Defects in p-type 4H and 6H SiC irradiated by 2.5 MeV electrons were studie d by electron paramagnetic resonance (EPR). Two anisotropic EPR spectra, la beled I and II, were observed in both 4H and 6H SIG. These spectra demonstr ating triclinic symmetry of the center can be described by an effective ele ctron spin S = 1/2. The angle alpha, between the direction of the principal g(z) of the g-tensors and the c-axis is determined as 63 degrees and 50 de grees for spectra I and II, respectively. In the 6H polytype, a third also similar EPR spectrum was detected. Based on their similarity in the electro nic structure (electron spin, symmetry, g values), annealing behavior and t emperature dependence, these spectra are suggested to be related to the sam e defect occupying different inequivalent lattice sites in 4H and 6H SiC. A pair between a silicon vacancy and an interstitial is a possible model for the defect. (C) 1999 Elsevier Science B.V. All rights reserved.