Determination of deep and shallow levels in conjugated polymers by electrical methods

Authors
Stallinga, P Gomes, HL Rost, H Holmes, AB Harrison, MG Friend, RH Biscarini, F Taliani, C Jones, GW Taylor, DM
Citation
P. Stallinga et al., Determination of deep and shallow levels in conjugated polymers by electrical methods, PHYSICA B, 274, 1999, pp. 923-926
Citations number
5
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICA B
ISSN journal
09214526 → ACNP
Volume
274
Year of publication
1999
Pages
923 - 926
Database
ISI
SICI code
0921-4526(199912)274:<923:DODASL>2.0.ZU;2-2
Abstract
Conjugated organic semiconductors have been submitted to various electrical measurement techniques in order to reveal information about shallow levels and deep traps in the forbidden gap. The materials consisted of poly[2-met hoxy, 5 ethyl (2' hexyloxy) paraphenylenevinylene] (MEH-PPV), poly(3-methyl thiophene) (PMeT), and alpha-sexithienyl (alpha T6) and the employed techni ques were IV, CV, admittance spectroscopy, TSC, capacitance and current tra nsients. (C) 1999 Elsevier Science B.V. All rights reserved.