Onset of step antibanding instability due to surface electromigration

Citation
K. Thurmer et al., Onset of step antibanding instability due to surface electromigration, PHYS REV L, 83(26), 1999, pp. 5531-5534
Citations number
25
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
83
Issue
26
Year of publication
1999
Pages
5531 - 5534
Database
ISI
SICI code
0031-9007(199912)83:26<5531:OOSAID>2.0.ZU;2-Y
Abstract
Heating by a direct electric current can produce step bunches:on vicinal se miconductor surfaces. Under extreme conditions, steps crossing from one bun ch to another bend sufficiently to create bands of steps of the opposite si gn (antibands). Unusual large scale scanning tunneling microscopy images re veal a mechanism where field-induced concentration gradients produce a spat ially variable step velocity that drives the antiband formation. A continuu m step model :allows quantitative analysis of crossing step shapes, yieldin g an effective charge for the diffusing adatoms of q(eff) = 0.13 electron u nits at 1270 degrees C.