A.c. conductivity and dielectric studies of silver-based fast ion conducting glass system

Different dopant salt (AgI) compositions in the AgI-Ag2O-SeO2-V2O5 (SSV) sy stem were prepared by the melt quenching technique. All the prepared compos itions of the SSV system were characterized by X-ray diffraction, IR and DS C. The electrical conductivity measurements were made on the various dopant salt contents of SSV glasses at 1 KHz as well as a function of frequency ( 5 Hz to 13 MHz) and temperature (295-323 K). The true bulk conductivity (si gma(e) = 2.61 x 10(-2) S/cm) and the electrical behavior (equivalent circui t) of the SSV glassy system were obtained from impedance analysis. The vari ation of conductivity with the AgI content in the SSV system was explained using the diffusion path model. Also, frequency dependence of dielectric co nstant (epsilon) and conductivity (sigma) were calculated using the impedan ce data, obtained for the various AgI contents of the SSV system. The varia tion of dielectric constant and conductivity with the frequency were explai ned by correlating the microscopic nature of the ionic conduction process i n the SSV system. (C) 2000 Elsevier Science B.V. All rights reserved.