PHOTOELECTRON-SPECTROSCOPY OF SILICON-FLUORINE AND GERMANIUM-FLUORINEBINARY CLUSTER ANIONS (SINFM-,GENFM-)

Citation
K. Kaya et al., PHOTOELECTRON-SPECTROSCOPY OF SILICON-FLUORINE AND GERMANIUM-FLUORINEBINARY CLUSTER ANIONS (SINFM-,GENFM-), Zeitschrift fur Physik. D, Atoms, molecules and clusters, 40(1-4), 1997, pp. 5-9
Citations number
37
Categorie Soggetti
Physics, Atomic, Molecular & Chemical
ISSN journal
01787683
Volume
40
Issue
1-4
Year of publication
1997
Pages
5 - 9
Database
ISI
SICI code
0178-7683(1997)40:1-4<5:POSAG>2.0.ZU;2-2
Abstract
Electronic properties of silicon-fluorine and germanium-fluorine clust er anions (SinFm-; n = 1-9, m = 1-3, GenFm-; n = 1-9, m = 1-3) were in vestigated by photoelectron spectroscopy using a magnetic-bottle type electron spectrometer. The binary cluster anions were generated by a l aser vaporization of a silicon/germanium rod in an He carrier gas mixe d with a small amount of SiF4 or F-2 gas. Comparison between photoelec tron spectra of SinF-/GenF- and Si-n(-)/Ge-n(-) (n = 4-9) gives the in sight that the doped F atom can remove one electron from the correspon ding Si-n(-)/Ge-n(-) cluster without any serious rearrangement of Si-n /Ge-n framework, because only the first peak of Si-n(-)/Ge-n(-), corre sponding singly occupied molecular orbital (SOMO), disappears and othe r successive spectral features are unchanged with the F atom doping.