Pulsed digital holographic interferometry with 694-and 347-nm wavelengths

A method for deformation analysis and shape measurement based on digital ho lography is presented. Two wavelengths, 694 and 347 nm, are used. The objec t is illuminated with the two wavelengths at the same time, and digital hol ograms are recorded on a CCD chip. The information corresponding to the two wavelengths is separated in the Fourier domain, and the phase correspondin g to the wave fronts is calculated. By recording holograms with two differe nt wavelengths at the same time, we can get measurements of deformations or shape with different sensitivities. Experimental results are presented. (C ) 2000 Optical Society of America OCIS codes: 070.2580, 090.1760, 100.2650, 070.2590, 090.2880, 190.2620.