A previously described automated thin-film deposition system based on rf-ma
gnetron sputtering could deposit quite complex optical multilayer systems w
ith good precision and with no one in attendance [Sullivan and Dobrowolski,
Appl. Opt. 32, 2351-2360 (1993)]. However, the deposition rate was slow, a
nd the uniform area on the substrate was limited. We describe an ac-magnetr
on sputtering process in which the same deposition accuracy has been combin
ed with significantly better film uniformity and a fivefold or sevenfold in
crease in the deposition rate. This makes the equipment of commercial inter
est. Experimental results are presented for several difficult coating probl
ems. (C) 2000 Optical Society of America OCIS codes: 310.1860, 310.0310, 31
0.1620.