Electroluminescence thermal quenching in SrS : Cu thin-film electroluminescent devices

Citation
Ba. Baukol et al., Electroluminescence thermal quenching in SrS : Cu thin-film electroluminescent devices, APPL PHYS L, 76(2), 2000, pp. 185-187
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
2
Year of publication
2000
Pages
185 - 187
Database
ISI
SICI code
0003-6951(20000110)76:2<185:ETQIS:>2.0.ZU;2-1
Abstract
Electroluminesence (EL) thermal quenching refers a reduction in luminance, concomitant with a reduction in transferred charge, when an alternating-cur rent thin-film electroluminescent (ACTFEL) device is operated at an elevate d temperature. EL thermal quenching is found to be significant in SrS:Cu AC TFEL devices operated above similar to 60-80 degrees C. Maximum transferred charge-maximum applied voltage (Q(max)-V-max) and transferred charge capac itance (i.e., dQ(max)/dV(max) vs V-max) measurements as a function of tempe rature in conjunction with ACTFEL device simulation are employed in order t o establish that EL thermal quenching arises from a thermally activated ann ihilation of positive space charge and a corresponding increase in the thre shold voltage. (C) 2000 American Institute of Physics. [S0003-6951(00)02902 -8].