Thickness-independent electron field emission from tetrahedral amorphous carbon films

Authors
Zhao, JP Chen, ZY Wang, X Shi, TS Yano, T
Citation
Jp. Zhao et al., Thickness-independent electron field emission from tetrahedral amorphous carbon films, APPL PHYS L, 76(2), 2000, pp. 191-193
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
2
Year of publication
2000
Pages
191 - 193
Database
ISI
SICI code
0003-6951(20000110)76:2<191:TEFEFT>2.0.ZU;2-F
Abstract
Electron field emission properties of tetrahedral amorphous carbon films of different thicknesses have been studied. The experimental results indicate that there exists no close relationship between threshold electric field a nd film thickness. Different field emission models are used to examine the experimental results in order to explain the thickness-independent electron field emission properties. (C) 2000 American Institute of Physics. [S0003- 6951(00)01102-5].