Na. Cingo et Gw. Small, Effects of bandwidth and overlap on multivariate calibration models based on simulated Fourier transform infrared interferogram data, APPL SPECTR, 53(12), 1999, pp. 1556-1566
Simulated Fourier transform infrared (FT-IR) interferograms and spectra of
mixture samples are used to investigate the effects of bandwidth and overla
p on a quantitative analysis in which multivariate calibration models are c
onstructed from short segments of digitally filtered interferogram data. By
a comparison of calibration models constructed with interferogram data to
similar models built with spectral data of varying instrumental resolution,
the concepts of spectral resolution are explored in the contest of an inte
rferogram-based analysis. In this work, nominal spectral point spacings of
1, 2, 4, 8, and 16 cm(-1) are explored. Five data sets are constructed in w
hich the width and overlap of an analyte and interference band are varied.
Calibration models based on partial least-squares (PLS) regression are opti
mized for both interferogram and spectral data. Even in cases of extreme sp
ectral overlap between the analyte and interference bands, interferogram-ba
sed calibration models constructed from segments of 151 points or less are
observed to perform as well as or better than all models computed with abso
rbance and single-beam spectral data, regardless of instrumental resolution
. These results suggest that an interferogram-based analysis is a viable op
tion for applications in which an FT-IR spectrometer is used in a dedicated
monitoring application.