Effects of bandwidth and overlap on multivariate calibration models based on simulated Fourier transform infrared interferogram data

Citation
Na. Cingo et Gw. Small, Effects of bandwidth and overlap on multivariate calibration models based on simulated Fourier transform infrared interferogram data, APPL SPECTR, 53(12), 1999, pp. 1556-1566
Citations number
12
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
APPLIED SPECTROSCOPY
ISSN journal
00037028 → ACNP
Volume
53
Issue
12
Year of publication
1999
Pages
1556 - 1566
Database
ISI
SICI code
0003-7028(199912)53:12<1556:EOBAOO>2.0.ZU;2-4
Abstract
Simulated Fourier transform infrared (FT-IR) interferograms and spectra of mixture samples are used to investigate the effects of bandwidth and overla p on a quantitative analysis in which multivariate calibration models are c onstructed from short segments of digitally filtered interferogram data. By a comparison of calibration models constructed with interferogram data to similar models built with spectral data of varying instrumental resolution, the concepts of spectral resolution are explored in the contest of an inte rferogram-based analysis. In this work, nominal spectral point spacings of 1, 2, 4, 8, and 16 cm(-1) are explored. Five data sets are constructed in w hich the width and overlap of an analyte and interference band are varied. Calibration models based on partial least-squares (PLS) regression are opti mized for both interferogram and spectral data. Even in cases of extreme sp ectral overlap between the analyte and interference bands, interferogram-ba sed calibration models constructed from segments of 151 points or less are observed to perform as well as or better than all models computed with abso rbance and single-beam spectral data, regardless of instrumental resolution . These results suggest that an interferogram-based analysis is a viable op tion for applications in which an FT-IR spectrometer is used in a dedicated monitoring application.