Characterization techniques - Complementary local structure and chemistry determinations using electrons, X-rays and proximal probes

Authors
Stern, EA Siegel, RW
Citation
Ea. Stern et Rw. Siegel, Characterization techniques - Complementary local structure and chemistry determinations using electrons, X-rays and proximal probes, CURR OP SOL, 4(4), 1999, pp. 321-323
Citations number
2
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE
ISSN journal
13590286 → ACNP
Volume
4
Issue
4
Year of publication
1999
Pages
321 - 323
Database
ISI
SICI code
1359-0286(199908)4:4<321:CT-CLS>2.0.ZU;2-P