Temperature and thermal stresses distribution near interface in sapphire crystals grown by EPG and GES methods

Authors
Krymov, VM Kurlov, VN Antonov, PI Galaktionov, EV Theodore, F
Citation
Vm. Krymov et al., Temperature and thermal stresses distribution near interface in sapphire crystals grown by EPG and GES methods, IAN FIZ, 63(9), 1999, pp. 1809-1815
Citations number
8
Categorie Soggetti
Physics
Journal title
IZVESTIYA AKADEMII NAUK SERIYA FIZICHESKAYA
ISSN journal
03676765 → ACNP
Volume
63
Issue
9
Year of publication
1999
Pages
1809 - 1815
Database
ISI
SICI code
0367-6765(199909)63:9<1809:TATSDN>2.0.ZU;2-L