Calculation of the vibrational linewidth and line shape of Raman spectra using the relaxation function. II. Application to the mixture neon-nitrogen with inhomogeneous broadening due to concentration fluctuations

Citation
Me. Kooi et al., Calculation of the vibrational linewidth and line shape of Raman spectra using the relaxation function. II. Application to the mixture neon-nitrogen with inhomogeneous broadening due to concentration fluctuations, J CHEM PHYS, 112(3), 2000, pp. 1404-1412
Citations number
20
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CHEMICAL PHYSICS
ISSN journal
00219606 → ACNP
Volume
112
Issue
3
Year of publication
2000
Pages
1404 - 1412
Database
ISI
SICI code
0021-9606(20000115)112:3<1404:COTVLA>2.0.ZU;2-5
Abstract
The Raman spectra of nitrogen in the mixture neon-nitrogen have been measur ed for neon mole fractions, x(M), of 0.10, 0.65, and 0.95 at 296 K and 408 K up to the solidification pressure. It was found that the frequency increa ses as a function of x(M). The linewidth is strongly composition dependent, with a very large value for x(M)=0.65. Further, it is shown that the width decreases as a function of temperature. Molecular dynamics simulations hav e been performed in order to calculate the linewidth and shape, using the r elaxation function. The simulations are in good agreement with experiment. It is shown that the increase in linewidth in the intermediate concentratio n range is due to an increase of the correlation time, rather than an incre ase of the amplitude of modulation. In this range inhomogeneous broadening due to concentration fluctuations occur: the vibrational line shape starts to deviate from a Lorentzian curve, and gets a Gaussian component. The simu lations also provide insight into the relatively large decrease of the widt h as a function of temperature in the intermediate concentration range. Whe n the temperature is increased from 296 to 408 K, the amplitude of modulati on increases, but the correlation time decreases more. (C) 2000 American In stitute of Physics. [S0021-9606(00)51602-X].