GaAs films grown on ferroelectric SrTiO3 substrates by molecular beam epita
xy are characterized, to the best of our knowledge, for the first time by u
sing photoluminescence (PL), scanning electron microscopy and secondary-ion
mass spectrometry measurement techniques. The results show that under the
current growth conditions the deposited GaAs material first forms 3D island
s on the SrTiO3 substrates and then with further increase in deposition thi
ckness of GaAs, a GaAs film with a very rough surface is formed. Optical tr
ansitions close to GaAs band-gap energy are observed for both the thin and
the relatively thick samples. The transition energy of the observed emissio
n labeled as F in the PL spectra shows a significant blue shift in comparis
on with the energy of the band-gap emissions in bulk GaAs. (C) 2000 Elsevie
r Science B.V. All rights reserved.