S. Kodama et al., Single crystalline bulk growth of In0.3Ga0.7As on GaAs seed using the multi-component zone melting method, J CRYST GR, 208(1-4), 2000, pp. 165-170
A 28 mm in length and 15 mm in diameter single-crystalline InxGa1-xAs terna
ry bulk crystal was grown on GaAs seed crystal using the multi-component zo
ne melting method. The InAs composition of the grown crystal was gradually
increased from 0.04 at the initial growth interface to 0.33 by decreasing t
he growth temperature as in the vertical gradient freeze method during grow
th of 24 mm length, and then maintained at 0.34 +/- 0.01 for the following
growth of 4 mm length by making the sample travel at a rate nearly equal to
the growth rate without lowering the furnace temperature. This combination
of temperature and sample traveling rate control enabled the growth of hom
ogeneous In0.3Ga0.7As ternary bulk crystal. (C) 2000 Elsevier Science B.V.
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